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Jordan Valley`s X-ray tool scoops CS Industry Metrology Tool Award 2013

The company's QC3 diffractometer is suited for analysing III-V semiconductor and nitride based LEDs. The production worthy system can accommodate up to 20 wafers in a single measurement process
Jordan Valley Semiconductor has announced that its QC3 diffractometer is the winner of the CS Industry 2013 Metrology, Test and Measurement award.

"The QC3 High-Resolution X-Ray Diffractometer is a true leapfrog technology over the existing X-ray technology within the compound semiconductor," says Paul Ryan, Corporate VP and UK site manager.



Winner of the CS Industry 2013 Metrology, Test and  Measurement Award : Jordan Valley for its QC3 X-ray diffractometer

The QC3 boasts more than an order-of-magnitude improvement in performance compared to previous systems, with scans taking seconds rather than minutes or even hours.

The productivity of the QC3 is further enhanced by the multi-sample stage that can accommodate up to 20 wafers in a single measurement process, with fully automated alignment, measurement, analysis and reporting, meaning an operator no longer needs to manually interpret and record data.

The QC3 uses Jordan Valley's RADS analysis software to provide fast and accurate structural information from the X-Ray data. The RADS software is recognised as one of the industry leaders in X-Ray analysis software.

These features of the QC3 system, coupled with the high data quality and throughput, leads to faster identification of epi excursions and their root causes, increasing yield and profit per wafer. Over 50 systems have already been shipped and installed in facilities across the world, mainly in China, Taiwan and USA.

The CS Industry Awards 2013 recognise success and development along the entire value chain of the Compound Semiconductor industry from research to completed device, focusing on the people, processes and products that drive the industry forward.

The CS Industry Awards will remind us what is good about the industry - the people who drive it with their technical expertise and customer orientated perspectives. Nominations are open to all companies, individuals and organisations within the CS industry and voting will occur through Compound Semiconductor online and print services.

"Jordan Valley is extremely proud to be named as winner of CS industry award," says Isaac Mazor, Jordan Valley founder and CEO. "Our growth is a testament to our entire organisation's commitment to technological superiority and to the wide adoption of our x-ray metrology into the advanced semiconductor manufacturing processes as well as other emerging markets such as the LED, GaN and other compound semiconductors."

Jordan Valley Semiconductors (JVS) develops manufactures and sells fully automated metrology tools for advanced technology nodes based on non-contacting and non-destructive tools.

The company offers the semiconductor industry the most comprehensive portfolio of advanced metrology tools, based on technologies such as XRR, XRF, XRD, HRXRD & XRDI (Imaging for defects).

JV provides two other product to the Compound industry: Delta-X for LED and QC Velox that is the next generation HRXRD system for Epi manufactory.

Jordan Valley's investors include Clal Industries and Investments Ltd., Intel Capital and Elron Electronics Industries Ltd..

With headquarters in Migdal Haemek Israel, the company has subsidiaries in Durham UK, Austin Texas USA, Dresden, Germany, Hsin-Chu Taiwan, Suwon Korea and worldwide representatives network.

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